TITLE:

Field emission scanning electron microscopy FE-SEM

DESCRIPTION:

The Zeiss ULTRA Plus electron microscope features a Schottky field emission system and multiple detectors: in-lens SE, Evernhart-Thornley SE, EsB BSE, angle-selective BSE, STEM, and CCD camera with infrared illumination. It also includes a device for sample surface charge equalization and an SDD detector with a working area of 50 mm² for analyzing the emitted X-ray light with INCA software. This setup ensures high-quality analysis of non-volatile solid samples, with data processing capabilities for publication-ready results.

Contact: dr. Erika Švara Fabjan (erika.svara@zag.si) 

PURCHASE DATE:

01.07.2010

IMAGES: