TITLE:
DESCRIPTION:
X-ray diffraction analysis (XRD) enables investigation of the structure of various materials:
their atomic arrangement,
measuring the average spacing between atomic layers,
determining the size and orientation of individual crystals,
determining the crystal structure of an unknown material,
measuring the size, shape and internal stresses of individual crystal regions, determination of possible irregularities.
An X-ray diffractometer is used to obtain qualitative diffraction data, such as measuring the stress difference on a metal sample, using a special module of the PAN Analytical Stress Software.
their atomic arrangement,
measuring the average spacing between atomic layers,
determining the size and orientation of individual crystals,
determining the crystal structure of an unknown material,
measuring the size, shape and internal stresses of individual crystal regions, determination of possible irregularities.
An X-ray diffractometer is used to obtain qualitative diffraction data, such as measuring the stress difference on a metal sample, using a special module of the PAN Analytical Stress Software.
PURCHASE DATE:
01.10.2015
IMAGES:
