TITLE:
Scanning electron microscope JEOL JSM-IT500 with EDS analyser Oxford Instruments
DESCRIPTION:
The JEOL JSM-IT500 SEM with EDS analyzer features:
• Low and high vacuum modes
• Resolution: 3.0 nm (30 kV), 15.0 nm (1.0 kV) in high vacuum; 4.0 nm (30 kV, BED) in low vacuum
• Magnification: 5x to 300,000x
• Secondary electron image (SEI) and three backscattered electron image modes (BED-T, BED-S, BED-C)
• W filament electron gun, fully automatic alignment
• Accelerating voltage: 0.3 to 30 kV
• Probe current: 1 pA to 1 µA
• Image acquisition: 640 x 480 to 5120 x 3840 pixels
• Max specimen size: 200 mm (diameter) x 75 mm (height)
EDS functions: qualitative and quantitative analysis, line and point analysis, elemental mapping.
Contact: mikroskop@zag.si, Mirjam Bajt Leban (mirjam.leban@zag.si
• Low and high vacuum modes
• Resolution: 3.0 nm (30 kV), 15.0 nm (1.0 kV) in high vacuum; 4.0 nm (30 kV, BED) in low vacuum
• Magnification: 5x to 300,000x
• Secondary electron image (SEI) and three backscattered electron image modes (BED-T, BED-S, BED-C)
• W filament electron gun, fully automatic alignment
• Accelerating voltage: 0.3 to 30 kV
• Probe current: 1 pA to 1 µA
• Image acquisition: 640 x 480 to 5120 x 3840 pixels
• Max specimen size: 200 mm (diameter) x 75 mm (height)
EDS functions: qualitative and quantitative analysis, line and point analysis, elemental mapping.
Contact: mikroskop@zag.si, Mirjam Bajt Leban (mirjam.leban@zag.si
PURCHASE DATE:
21.12.2018
IMAGES:
